Hello!

Here goes my fourth status report on reducing the RTT of Tor circuits: I continued to evaluate lots of RTT-data of Tor circuits and drew some conclusions from that: *) The RTT measurements of circuits are subject to multiple influences and hence very diverse. *) There is no single distribution that fits them for all circuits.

I am currently in the process of doing a demonstration of the improvement the active RTT probing yields. I delayed this report to provide some actual results but the demo is still half-baked..

Best, Robert